Bifilar AC-DC resistor using a microwire

Author

Semyonov, Yu.P. ; Klebanov, I. ; Lee, Rae Duk ; Kim, Han Jun

Author_Institution

D.I Medeleyev Inst. of Metrol., St. Petersburg, Russia

Volume

46

Issue

2

fYear

1997

fDate

4/1/1997 12:00:00 AM

Firstpage

333

Lastpage

336

Abstract

Bifilar ac-dc resistors of 6.45 kΩ to 103.2 kΩ consisting of a microwire and a fused silica bar, with extended nominal resistance, improved stability and reduced mechanical sensitivity, have been investigated and fabricated. In this resistor, a fused-silica rectangular bar was inserted between the wires of the bifilar loop to support the microwires and to increase capacitance between the wires. From resistance measurements at ac and dc for several resistors, the frequency correction factor was evaluated to be less than 2×10^-8 in the frequency range from dc to 1.6 kHz. The resistors can be used as transportable standards for direct comparison with the quantized Hall resistance at both dc and ac, for calibration of the ac standard resistors and the ratio of transformer bridges

Keywords

calibration; electric resistance measurement; measurement standards; quantum Hall effect; resistors; stability; 0 to 1.6 kHz; 6.45 to 103.2 kohm; SiO₂; bifilar AC-DC resistor; direct comparison; extended nominal resistance; frequency correction factor; fused silica bar; fused-silica rectangular bar; mechanical sensitivity; microwire; quantized Hall resistance; stability; transformer bridges; transportable standards; Calibration; Capacitance; Electrical resistance measurement; Frequency; Resistors; Silicon compounds; Stability; Thermal resistance; Vibrations; Wires;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/19.571850

Filename

571850