Abstract :
In summary, 138 authors submitted extended versions of their conference papers to this special issue. After a thorough review process, and as of mid-Ianuary 2012, 41 papers have been accepted, and another ten are in various stages of review. Technical topics covered in this special issue, although wide ranging as reflected in part by the diversity of the papers, demonstrate recent developments in the field of instrumentation and measurement and possible approaches that may offer solutions to existing measurement and monitoring problems. We hope that this special issue provides a good reference point for the researchers and practitioners who are active in the field and will serve as a catalyst to trigger further worthwhile investigations.
