Title :
On-Line Fault Recognition System for the Analogic Channels of VVER 1000/400 Nuclear Reactors
Author :
Yazikov, Mikhail ; Gola, Giulio ; Berg, Øivind ; Porsmyr, Jan ; Valseth, Helge ; Roverso, Davide ; Hoffmann, Mario
Author_Institution :
Inst. for Energy Technol., Halden, Norway
fDate :
4/1/2012 12:00:00 AM
Abstract :
In this paper, a method for on-line fault diagnosis of analogic channels of the VVER1000/440 monitoring systems is proposed. The method is based on the analysis of the amplitude fluctuations of electrical signals at the output of analogic channels. The advantage of this method is the possibility to perform on-line fault diagnosis of the monitoring system during the normal operation of the nuclear power plant. The method is also considered to be simple enough for practical implementation and use. The paper presents the practical results of the tests carried out to verify the method with the aim of demonstrating that the shape of the histograms of the amplitude fluctuations characterizes different types of sensor faults and component faults in the analogic channels, such as drifts, frozen or noisy signals. The parameters of the histograms of the amplitude fluctuations are used to construct a fault recognition system which is based on the Pearson´s chi-square criterion for verifying the probability hypothesis of the discrete random variable.
Keywords :
fission reactor monitoring; fission reactor safety; light water reactors; nuclear engineering computing; Pearson chi-square criterion; VVER 1000/400 nuclear reactors; VVER 1000/440 monitoring systems; amplitude fluctuations analysis; analogic channel output; component faults; discrete random variable; electrical signals; nuclear power plant; on-line fault diagnosis; on-line fault recognition system; sensor faults; Histograms; Monitoring; Noise; Power generation; Shape; Signal resolution; Temperature measurement; Amplitudes fluctuations histograms; analogic channels; chi-square; fault diagnosis; fault recognition;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2012.2184553