• DocumentCode
    1455906
  • Title

    Nonlinearity correction of the integrated time-to-digital converter with direct coding

  • Author

    Pelk, Ryszard ; Kalisz, Jozef ; Szplet, Ryszard

  • Author_Institution
    Mil. Univ. of Technol., Warsaw, Poland
  • Volume
    46
  • Issue
    2
  • fYear
    1997
  • fDate
    4/1/1997 12:00:00 AM
  • Firstpage
    449
  • Lastpage
    453
  • Abstract
    A method is presented for automated identification and correction of the nonlinearity error of the time-to-digital converter (TDC) with delay-line coding and 200 ps resolution, integrated on a single Field Programmable Gate Array (FPGA) device. The nonlinearity error is estimated using a statistical method based on a sufficiently large number N of measurements of random input time intervals having a uniform distribution within the input range of TDC. Then, the resulting estimate of the error function is used for training a two-layer neural network (NN) designed for correction of the nonlinearity error. Training of the NN is based on the fast Levenberg-Marquardt (LM) learning rule and the goal is to minimize the maximum nonlinearity error of the TDC. Experimental tests have shown, that using a relatively small number of N=5×104 identification measurements the maximum nonlinearity error of a TDC may be reduced from 1.37 LSB (least significant bit) to about 0.12 LSB (24 ps)
  • Keywords
    analogue-digital conversion; delay lines; field programmable gate arrays; learning (artificial intelligence); multilayer perceptrons; 24 to 200 ps; FPGA; Levenberg-Marquardt learning rule; delay-line coding; direct coding; error function; integrated time-to-digital converter; nonlinearity correction; statistical method; two-layer neural network; CMOS logic circuits; Delay lines; Error correction; Field programmable gate arrays; Neural networks; Pulse measurements; Quantization; Statistical analysis; Testing; Time measurement;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/19.571882
  • Filename
    571882