DocumentCode :
1455938
Title :
Capacitance scaling system
Author :
Aoki, Toshiaki ; Yokoi, Katsumi
Author_Institution :
Meas. Standards Center, Hewlett-Packard Japan Ltd., Tokyo, Japan
Volume :
46
Issue :
2
fYear :
1997
fDate :
4/1/1997 12:00:00 AM
Firstpage :
474
Lastpage :
476
Abstract :
A capacitance scaling system has been developed and consists of a commercially available four-terminal-pair LCR meter, an inductive voltage divider (IVD), and a 1000 pF air dielectric capacitor. It can calibrate capacitors up to 1 μF in the frequency range from 50 Hz to 100 kHz. The combined standard uncertainty for the 0.01 μF at 100 kHz is estimated to be ±73 fF (7.3×10-6)
Keywords :
calibration; capacitance measurement; measurement errors; measurement standards; voltage dividers; 1000 pF; 50 Hz to 100 kHz; air dielectric capacitor; calibration; capacitance scaling system; combined standard uncertainty; four-terminal-pair LCR meter; inductive voltage divider; Calibration; Capacitance measurement; Capacitors; Dielectric measurements; Frequency; Impedance measurement; Measurement standards; NIST; Testing; Voltage;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/19.571889
Filename :
571889
Link To Document :
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