DocumentCode :
1455945
Title :
Development of a rapid-single-flux-quantum shift register for applications in RF noise power metrology
Author :
Kessel, Wolfgang ; Buchholz, Friedrich-Immanuel ; Khabipov, Marat I. ; Dolata, Ralf ; Niemeyer, Jurgen
Author_Institution :
Phys. Tech. Bundesanstalt, Braunschweig, Germany
Volume :
46
Issue :
2
fYear :
1997
fDate :
4/1/1997 12:00:00 AM
Firstpage :
477
Lastpage :
481
Abstract :
Shift registers operated in digital feedback mode and utilized as pseudo random noise generators are very attractive for application as noise standards in rf noise power metrology. The paper reports on the concept of the integrated circuits required, based on superconducting Rapid-Single-Flux-Quantum (RSFQ) logic, and realized in Nb/Al2O3-Al/Nb technology. The design and layout of an 8-bit shift register is presented. Measurement results are reported which prove correct functionality for clock frequencies up to 45 GHz for standard operation. Typical bias current margins for operation of the shift register are ±27%. Further narrow-band limited ranges of operation have been found up to 60 GHz
Keywords :
aluminium; aluminium compounds; calibration; electric noise measurement; feedback; measurement standards; niobium; shift registers; superconducting logic circuits; 0 to 60 GHz; 8 bit; Nb-Al2O3-Al-Nb; Nb/Al2O3-Al/Nb; RF noise power metrology; bias current margins; clock frequencies; digital feedback mode; narrow-band limited ranges; noise standards; rapid-single-flux-quantum shift register; superconducting RSFQ logic; Feedback; Integrated circuit noise; Integrated circuit technology; Metrology; Niobium; Noise generators; Shift registers; Superconducting device noise; Superconducting integrated circuits; Superconducting logic circuits;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/19.571890
Filename :
571890
Link To Document :
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