DocumentCode :
1455963
Title :
Comparison of the Unbalanced Faults in Three-Phase Resistive and Matrix-Type SFCLs
Author :
Choi, Hyo-Sang ; Cho, Yong-Sun ; Jung, Byung-Ik ; Chung, Dong-Chul ; Fathy, Aly
Author_Institution :
Dept. of Electr. Eng., Chosun Univ., Gwangju, South Korea
Volume :
20
Issue :
3
fYear :
2010
fDate :
6/1/2010 12:00:00 AM
Firstpage :
1215
Lastpage :
1218
Abstract :
The symmetrical components of the three-phase resistive-type and three-phase matrix-type superconducting fault current limiters (SFCL) were analyzed in the single line-to-ground fault and the double line-to-ground fault using symmetrical component calculus. Positive sequence current was highest in the resistive-type SFCL with a single line-to-ground fault and in the 380 turns matrix-type SFCL with a double line-to-ground fault, and negative sequence current was lowest in the resistive-type SFCL with a single line-to-ground fault. These indicate that and are determined from the total impedance of the SFCL and the uniform quenching characteristics of the superconducting element. Zero sequence current rapidly appeared from the three-phase resistive-type SFCL, but approached zero after three cycles. The application of magnetic field in the three-phase matrix-type induced the simultaneous quench of the superconducting elements, but a large amount of the symmetrical component appeared after three cycles from the fault occurrence due to the shunt resistor and the shunt reactor.
Keywords :
earthing; fault current limiters; double line-to-ground fault; negative sequence current; positive sequence current; shunt reactor; shunt resistor; single line-to-ground fault; symmetrical component calculus; three-phase matrix-type superconducting fault current limiters; three-phase resistive-type superconducting fault current limiters; zero sequence current; Current unbalance factor (IUF); symmetrical components; three-phase matrix-type SFCL; unbalanced fault;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/TASC.2010.2043662
Filename :
5439732
Link To Document :
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