Title :
New structure for a six-port reflectometer in monolithic microwave integrated-circuit technology
Author :
Wiedmann, Frank ; Huyart, Bernard ; Bergeault, Eric ; Jallet, Louis
Author_Institution :
Ecole Nat. Superieure des Telecommun., Paris, France
fDate :
4/1/1997 12:00:00 AM
Abstract :
This paper presents a new structure for a six-port reflectometer which due to its simplicity can be implemented very easily in monolithic microwave integrated-circuit (MMIC) technology. It uses nonmatched diode detectors with a high input impedance which are placed around a phase shifter in conjunction with a power divider for the reference detector. The circuit has been fabricated using the F20 GaAs process of the GEC-Marconi foundry and operates between 1.3 GHz and 3.0 GHz
Keywords :
III-V semiconductors; MMIC; S-parameters; gallium arsenide; microwave reflectometry; phase shifters; reflectometers; 1.3 to 3 GHz; GEC-Marconi foundry; GaAs; GaAs process; MMIC; S-parameter measurement; monolithic microwave integrated-circuit; nonmatched diode detectors; phase shifter; power divider; six-port reflectometer; Envelope detectors; Foundries; Gallium arsenide; Impedance; Integrated circuit technology; MMICs; Microwave technology; Phase detection; Phase shifters; Power dividers;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
