Title :
Measured backscatter from conductive thin films deposited on fibrous substrates
Author :
Gurton, Kristan P. ; Bruce, Charles W. ; Gillespie, J.B.
Author_Institution :
Army Res. Lab., Adelphi, MD, USA
fDate :
11/1/1998 12:00:00 AM
Abstract :
The functional dependence of the electromagnetic backscatter by thin, straight, dielectric fibers with metallic coatings was measured as a function of coating thickness and conductivity at a wavelength of 0.86 cm (35 GHz). Cu and Ni coatings were applied to fibrous glass substrates (having a nominal diameter of 5.50 μm) using an evaporative process. The thicknesses of the thin films were directly measured by scanning electron microscopy (SEM) and ranged from 0.02 to 0.70 μm. Measurements were conducted using single fibers. Measured quantities agreed well with calculations based on previously developed theory
Keywords :
backscatter; conductors (electric); copper; electromagnetic wave scattering; glass fibres; metallic thin films; microwave measurement; microwave spectra; nickel; scanning electron microscopy; vacuum deposited coatings; 0.02 to 0.7 micron; 0.86 cm; 2.75 micron; 35 GHz; Cu; Ni; SEM; coating thickness; coatings; conductive thin films; conductivity; diameter; electromagnetic backscatter; evaporative process; fibrous glass substrates; fibrous substrates; measured backscatter; metallic coatings; microwave frequency; scanning electron microscopy; straight dielectric fibers; wavelength; Backscatter; Coatings; Conductive films; Conductivity measurement; Dielectric measurements; Dielectric substrates; Dielectric thin films; Electromagnetic measurements; Thickness measurement; Wavelength measurement;
Journal_Title :
Antennas and Propagation, IEEE Transactions on
