DocumentCode
1456198
Title
Calorimetric measurements of microwave surface resistance at cryogenic temperatures
Author
Andreone, Domenico ; Brunetti, Luciano ; Giordanino, Claudio ; Petrizzelli, Mario
Author_Institution
IEN Galileo Ferraris, Torino, Italy
Volume
46
Issue
2
fYear
1997
fDate
4/1/1997 12:00:00 AM
Firstpage
535
Lastpage
538
Abstract
The measurement of the surface resistance has always been a difficult challenge at microwave frequencies, especially if it concerns superconductors in the transition region where the accuracy of the measurements is strongly influenced by the temperature fluctuations. In this paper we present a new method to measure the microwave surface resistance of superconducting thin-films at cryogenic temperatures. The method, based on the principle of the equivalence of the thermal effects, is effective for the superconductors that generally have a good bolometric behavior in the transition region. It is a complementary approach to the usual resonant cavity methods which fail near the Tc because of thermal instability. In practice we use a microcalorimeter whose thermal load is a superconducting thin-film that works as a matched bolometer in a quasiadiabatic environment and in a well known thermodynamical equilibrium. The total uncertainty of the surface resistance measurements made with our method is estimated to be about 1.5%. The apparatus has been tested in the Ka frequency band (26.5 to 40) GHz for low-Tc superconductors and it is also proposed for the high-Tc thin-films that require a thermal environment less critical than liquid helium
Keywords
bolometers; calorimetry; electric resistance measurement; high-temperature superconductors; low-temperature techniques; microwave measurement; superconducting thin films; 26.5 to 40 GHz; Ka frequency band; bolometric behavior; calorimetric measurements; cryogenic temperatures; matched bolometer; microwave surface resistance; quasiadiabatic environment; superconducting thin-films; temperature fluctuations; thermal effects; thermal instability; thermodynamical equilibrium; total uncertainty; transition region; Electrical resistance measurement; Fluctuations; Frequency measurement; Microwave frequencies; Microwave measurements; Superconducting microwave devices; Superconducting thin films; Superconducting transition temperature; Superconductivity; Surface resistance;
fLanguage
English
Journal_Title
Instrumentation and Measurement, IEEE Transactions on
Publisher
ieee
ISSN
0018-9456
Type
jour
DOI
10.1109/19.571904
Filename
571904
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