Title :
Optical network analysis and longitudinal structure characterization of fiber Bragg grating
Author :
Sandel, David ; Noé, Reinhold ; Heise, G. ; Borchert, B.
Author_Institution :
Dept. of Electr. Eng. Commun., Paderborn Univ., Germany
fDate :
12/1/1998 12:00:00 AM
Abstract :
A method for polarization-resolved optical fiber Bragg grating (FBG) characterization is reported on. The complete reflectance Jones matrix is measured interferometrically. Required polarization transformers need not be accurate, just to operate reproducibly, because redundant measurements yield pairs of orthogonal polarizations. Local dichroic reflectivity and birefringence of a sampled grating was derived from this data. Knowledge of these quantities should allow improvement of the ultraviolet (UV) illumination process and to effectively correct phase mask errors by longitudinally selective UV light postprocessing
Keywords :
Bragg gratings; light interferometry; matrix algebra; optical fibre polarisation; optical fibre testing; reflectivity; refractive index; UV illumination process; complete reflectance Jones matrix; fiber Bragg grating; local dichroic reflectivity; longitudinal structure characterization; longitudinally selective UV light postprocessing; optical network analysis; orthogonal polarizations; phase mask errors; polarization transformers; polarization-resolved optical fiber Bragg grating characterization; redundant measurements; sampled grating; Birefringence; Bragg gratings; Fiber gratings; Lighting; Optical fiber networks; Optical fiber polarization; Optical fibers; Optical interferometry; Reflectivity; Transformers;
Journal_Title :
Lightwave Technology, Journal of
