• DocumentCode
    1456451
  • Title

    Dynamic threshold pass-transistor logic for improved delay at lower power supply voltages

  • Author

    Lindert, Nick ; Sugii, Toshihiro ; Tang, Stephen ; Hu, Chenming

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., California Univ., Berkeley, CA, USA
  • Volume
    34
  • Issue
    1
  • fYear
    1999
  • fDate
    1/1/1999 12:00:00 AM
  • Firstpage
    85
  • Lastpage
    89
  • Abstract
    We have investigated circuit options to surpass the 1 V power-supply limitation predicted by traditional scaling guidelines. By modulating the body bias, we can dynamically adjust the threshold voltage to have different on- and off-state values. Several dynamic threshold voltage MOSFET (DTMOS) logic styles were analyzed for ultralow-power use-from 1.5 down to 0.5 V. Since ordinary pass-transistor logic degrades as the voltages are reduced, we investigated the effects that a dynamic threshold has on various styles of pass-transistor logic. Three different pass-transistor restoration schemes were simulated with the various DTMOS techniques. Results indicate that controlling the body bias can provide a substantial speed increase and that such techniques are useful over a large range of supply voltages. Process complexity and other tradeoffs associated with DTMOS logic variations are also discussed
  • Keywords
    MOS logic circuits; delays; logic gates; low-power electronics; 0.5 to 1.5 V; body bias modulation; delay improvement; dynamic adjustment; dynamic threshold pass-transistor logic; dynamic threshold voltage MOSFET logic styles; pass-gate comparison; pass-transistor restoration schemes; power supply voltage scaling; threshold voltage; ultralow-power use; Degradation; Delay; Dynamic voltage scaling; Guidelines; Logic circuits; Low voltage; MOSFET circuits; Microprocessors; Power supplies; Threshold voltage;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/4.736659
  • Filename
    736659