The improved voltage life characteristics of EHV XLPE cables

Author

Fukui, Takeshi ; Hirotsu, Kenichi ; Uozumi, Tsuyoshi

Author_Institution

Sumitomo Electr. Ind. Ltd., Osaka, Japan

Volume

14

Issue

1

fYear

1999

fDate

1/1/1999 12:00:00 AM

Firstpage

31

Lastpage

38

Abstract

Although many researchers have investigated voltage life characteristics of XLPE cables, the voltage life curve of XLPE insulation has not been made clear because of large deviations in the obtained data. Moreover, the voltage life curve of a XLPE cable, which is significantly affected by defect size and shape, cannot be applied to another cable having different defects. The authors obtained an intrinsic stress life curve of XLPE which included no defects. The intrinsic stress life curve demonstrates the existence of a threshold stress, which causes no degradation in the insulation. The application of the intrinsic stress life curve makes possible to estimate the voltage life curve of any cable with known defects. A method for calculating the defect size that would not initiate any degradation in XLPE insulation under a given electrical stress is proposed

Keywords

XLPE insulation; electric breakdown; insulation testing; power cable insulation; power cable testing; 500 kV; EHV XLPE power cables; defect size; insulation degradation; intrinsic stress life curve; threshold stress; voltage life characteristics improvement; voltage life curve; Cable insulation; Conductors; Degradation; Dielectrics and electrical insulation; Electric breakdown; Impurities; Shape control; Stress; Trees - insulation; Voltage;

fLanguage

English

Journal_Title

Power Delivery, IEEE Transactions on

Publisher

ieee

ISSN

0885-8977

Type

jour

DOI

10.1109/61.736676

Filename

736676