Title :
Pitfalls in the Determination of Optical Cross Sections From Surface Integral Equation Simulations
Author :
Kern, Andreas M. ; Martin, Olivier J F
Author_Institution :
Nanophotonics & Metrol. Lab., Swiss Fed. Inst. of Technol. Lausanne (EPFL), Lausanne, Switzerland
fDate :
6/1/2010 12:00:00 AM
Abstract :
Calculation of electromagnetic cross sections from surface integral equation simulations, a popular approach in microwave studies and recently also in optics and plasmonics, requires only a single post-processing step, which can, however, be very sensitive to the precision of the simulation result. We investigate the accuracy and robustness of two methods for cross section calculation, displaying when and why errors may occur, in certain cases even unphysical behavior. A calculation recipe which avoids unphysical results is given, ensuring convergence of all obtained cross sections. This study will help judge the accuracy of performed simulations and can prevent misinterpretation of modeling results.
Keywords :
electromagnetic wave scattering; integral equations; surface electromagnetic waves; electromagnetic cross sections; optical cross sections; surface integral equation; Absorption; Electromagnetic fields; Electromagnetic scattering; Electromagnetic wave absorption; Integral equations; Optical scattering; Optical sensors; Optical surface waves; Particle scattering; Plasmons; Radar cross section; Radar scattering; Absorbing media; boundary element methods; integral equations; scattering;
Journal_Title :
Antennas and Propagation, IEEE Transactions on
DOI :
10.1109/TAP.2010.2046870