DocumentCode :
1457044
Title :
Pitfalls in the Determination of Optical Cross Sections From Surface Integral Equation Simulations
Author :
Kern, Andreas M. ; Martin, Olivier J F
Author_Institution :
Nanophotonics & Metrol. Lab., Swiss Fed. Inst. of Technol. Lausanne (EPFL), Lausanne, Switzerland
Volume :
58
Issue :
6
fYear :
2010
fDate :
6/1/2010 12:00:00 AM
Firstpage :
2158
Lastpage :
2161
Abstract :
Calculation of electromagnetic cross sections from surface integral equation simulations, a popular approach in microwave studies and recently also in optics and plasmonics, requires only a single post-processing step, which can, however, be very sensitive to the precision of the simulation result. We investigate the accuracy and robustness of two methods for cross section calculation, displaying when and why errors may occur, in certain cases even unphysical behavior. A calculation recipe which avoids unphysical results is given, ensuring convergence of all obtained cross sections. This study will help judge the accuracy of performed simulations and can prevent misinterpretation of modeling results.
Keywords :
electromagnetic wave scattering; integral equations; surface electromagnetic waves; electromagnetic cross sections; optical cross sections; surface integral equation; Absorption; Electromagnetic fields; Electromagnetic scattering; Electromagnetic wave absorption; Integral equations; Optical scattering; Optical sensors; Optical surface waves; Particle scattering; Plasmons; Radar cross section; Radar scattering; Absorbing media; boundary element methods; integral equations; scattering;
fLanguage :
English
Journal_Title :
Antennas and Propagation, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-926X
Type :
jour
DOI :
10.1109/TAP.2010.2046870
Filename :
5439887
Link To Document :
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