• DocumentCode
    1457397
  • Title

    Diffusion of two-dimensional hot electrons in semiconductor quantum wells at low temperatures

  • Author

    Chattopadhyay, D. ; Kabasi, A. ; Rakshit, P.C.

  • Author_Institution
    Inst. of Radio Phys. & Electron., Calcutta Univ., India
  • Volume
    35
  • Issue
    10
  • fYear
    1988
  • fDate
    10/1/1988 12:00:00 AM
  • Firstpage
    1672
  • Lastpage
    1675
  • Abstract
    A theoretical approach is developed to study the diffusivity of two-dimensional degenerate hot electrons in a quantum well by a semianalytic solution of the Boltzmann equation, including the effect of the diffusion current on the distribution function. Calculations are done with GaAs material parameters for a well 60 Å wide and a sheet carrier concentration of 7×1011 cm-2 at a lattice temperature of 4.2 K and electron temperatures below 40 K, where momentum is predominantly relaxed through background impurity scattering and energy is predominantly relaxed through deformation potential acoustic scattering. The diffusion is found to be strongly anisotropic, the longitudinal-to-transverse diffusivity ratio increasing with the increased heating of the electron gas. Also, the diffusivity of the two-dimensional electron gas is shown to be more field-dependent than that of the bulk material
  • Keywords
    III-V semiconductors; diffusion in solids; gallium arsenide; hot carriers; semiconductor junctions; 4.2 K; 60 A; Boltzmann equation; GaAs; background impurity scattering; deformation potential acoustic scattering; degenerate hot electrons; diffusion current; diffusivity; distribution function; electron temperatures; lattice temperature; longitudinal-to-transverse diffusivity ratio; low temperatures; semianalytic solution; semiconductor quantum wells; sheet carrier concentration; two-dimensional electron gas; two-dimensional hot electrons; Acoustic materials; Acoustic scattering; Boltzmann equation; Distribution functions; Electrons; Gallium arsenide; Quantum mechanics; Semiconductor materials; Sheet materials; Temperature;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.7371
  • Filename
    7371