• DocumentCode
    1457678
  • Title

    Direct-coupled electronics for high-temperature superconductor DC SQUID-based magnetometer

  • Author

    Gudoshnikov, Sergey A. ; Ukhansky, Nikolay ; Vengrus, Igor I. ; Matveets, Ludmila V. ; Andreev, Konstantin E. ; Snigirev, Oleg ; Krasnosvobodtsev, Sergei I.

  • Author_Institution
    Inst. of Terrestrial Magnetism, Ionosphere & Radiowave Propagation, Acad. of Sci., Troitsk, Russia
  • Volume
    46
  • Issue
    2
  • fYear
    1997
  • fDate
    4/1/1997 12:00:00 AM
  • Firstpage
    624
  • Lastpage
    628
  • Abstract
    A low-volume, high-performance, direct-coupled electronic system for high-Tc dc SQUID magnetometers has been developed and tested. This system is based on a liquid nitrogen-cooled amplifier and a modified integrator. The amplifier has a white noise voltage level close to 0.25 nVHz, a current noise of the order of 3 pAHz , a gain equal to 3000, a 3 dB bandwidth of about 370 kHz, and a package volume less than 3 cm3. The modified integrator has an input resistance of the order to 10 kΩ and a considerably high output drive current of about 30 mA. This unique combination results in the typical electronic 3 dB bandwidth of about 1 MHz, a dynamic range of ±5×106 Hz for frequencies up to 1.6 kHz, and a slew rate of 1×106 flux quanta/s in a wide signal frequency range for a middle-quality high-Tc dc SQUID sensor
  • Keywords
    SQUID magnetometers; high-temperature superconductors; magnetic field measurement; white noise; 1 MHz; 10 kohm; 30 mA; 370 kHz; DC SQUID-based magnetometer; current noise; direct-coupled electronics; dynamic range; high-temperature superconductor; input resistance; liquid nitrogen-cooled amplifier; output drive current; package volume; slew rate; white noise voltage level; Bandwidth; Electronic equipment testing; Frequency; High temperature superconductors; Noise level; SQUID magnetometers; Superconducting device noise; System testing; Voltage; White noise;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/19.571940
  • Filename
    571940