DocumentCode :
145772
Title :
From modeling to fabrication of double side microstructured silicon windows for infrared gas sensing in Harsh environments
Author :
Bergmann, R. ; Ivinskaya, A. ; Kafka, J. ; Okkels, F. ; Jakobsen, Mogens H.
Author_Institution :
Dept. of Micro- & Nanotechnol., Tech. Univ. of Denmark, Lyngby, Denmark
fYear :
2014
fDate :
25-28 Aug. 2014
Firstpage :
58
Lastpage :
60
Abstract :
Commercial infrared windows used for gas sensing in the mid-IR range usually possess an anti-reflective coating. Those coatings can normally not withstand harsh environments, particularly not high temperatures. With a simple “3-step” fabrication process, high temperature resistant silicon windows (Ø1") were manufactured. The windows show high temperature resistant sub-wavelength anti-reflective surface microstructures on both side faces. Thus, a peak transmittance of 100% for a defined main wavelength (5 μm) and more than 90 % average transmittance for the wavelength range of 5-7 μm was achieved. The modeling of the anti-reflective microstructures, their fabrication process and final transmittance analysis of the windows is discussed.
Keywords :
gas sensors; infrared detectors; optical fabrication; optical windows; silicon; antireflective coating; double side microstructured silicon; gas sensing; infrared gas sensing; infrared windows; peak transmittance; transmittance analysis; Coatings; Fabrication; Resistance; Silicon; Temperature measurement; Temperature sensors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Advanced Electromagnetic Materials in Microwaves and Optics (METAMATERIALS), 2014 8th International Congress on
Conference_Location :
Lyngby
Print_ISBN :
978-1-4799-3450-8
Type :
conf
DOI :
10.1109/MetaMaterials.2014.6948594
Filename :
6948594
Link To Document :
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