• DocumentCode
    1457970
  • Title

    Current Spreading Efficiency and Fermi Level Pinning in GaInNAs–GaAs Quantum-Well Laser Diodes

  • Author

    Bajo, Miguel Montes ; Hierro, Adrian ; Ulloa, Jose Maria ; Miguel-Sanchez, J. ; Guzman, Alvaro ; Damilano, B. ; Hugues, Maxime ; Al Khalfioui, Mohamed ; Duboz, Jean-Yves ; Mass, Jean

  • Author_Institution
    Dept. de Ing. Electron., Univ. Politec. de Madrid, Madrid, Spain
  • Volume
    46
  • Issue
    7
  • fYear
    2010
  • fDate
    7/1/2010 12:00:00 AM
  • Firstpage
    1058
  • Lastpage
    1065
  • Abstract
    The role of the current spreading efficiency, ?s, on the degradation of the figures of merit of stripe geometry GaInNAs-GaAs quantum well (QW) laser diodes (LDs) is studied as a function of the N content in the range from 0 to 3.3%. It is found that, in N-containing devices, Jth is strongly dependent on the current injection location along the stripe. This is attributed to a poor spreading of carriers along the length of the laser stripe when N is present in the diodes. If the current is injected using two parallel probes, the threshold current turns out to be nearly independent on the position of the current injection sites and carrier distribution along the laser stripe is similar in N-free and N-containing devices. A model is proposed to explain this phenomenon in which the low-populated portions of the QW are pumped optically by reabsorption of the photons emitted by the high-populated portions of the QW. Local heating in N-containing devices would cause a temperature gradient along the stripe that hinders this optical pumping of the lowly-injected portion of the cavity. The value of the lateral component of ?s, ?s lat, is evaluated by measuring the degree of above-threshold Fermi level pinning in the QW using two probes so any variation in ?s will arise from variations in ?s lat only. To do so, the partially amplified spontaneous emission from the laser diodes is measured above and below threshold, and the result is used to calculate ?s. It is found that ?s decreases by ~ 18% upon addition of N. This reduction can account for half of the observed reduction in the internal quantum efficiency, ?i, in N-containing LDs with respect to N-free devices. The rest of the degradation of ?i could be accounted for by another recombination mechanism such as non-radiative recombination at defects in the barriers. The physical mechanisms responsi- ble for the degradation of ?s are discussed and various alternative models are proposed.
  • Keywords
    Fermi level; III-V semiconductors; electron-hole recombination; gallium arsenide; gallium compounds; indium compounds; laser cavity resonators; optical pumping; quantum well lasers; semiconductor quantum wells; superradiance; GaInNAs-GaAs; current injection; current spreading efficiency; fermi level pinning; internal quantum efficiency; laser cavity; laser stripe; nonradiative recombination; optical pumping; partially amplified spontaneous emission; photon reabsorption; quantum well laser diodes; Degradation; Diode lasers; Geometrical optics; Laser modes; Optical pumping; Probes; Pump lasers; Quantum well lasers; Radiative recombination; Threshold current; Current spreading efficiency; Fermi level pinning; GaInNAs; dilute nitrides; quantum-well laser diodes;
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/JQE.2010.2043219
  • Filename
    5440022