• DocumentCode
    1458096
  • Title

    Predicting where faults can hide from testing

  • Author

    Voas, Jeffrey ; Morell, Larry ; Miller, Keith

  • Author_Institution
    NASA Langley Res. Center, Hampton, VA, USA
  • Volume
    8
  • Issue
    2
  • fYear
    1991
  • fDate
    3/1/1991 12:00:00 AM
  • Firstpage
    41
  • Lastpage
    48
  • Abstract
    Sensitivity analysis, which estimates the probability that a program location can hide a failure-causing fault, is addressed. The concept of sensitivity is discussed, and a fault/failure model that accounts for fault location is presented. Sensitivity analysis requires that every location be analyzed for three properties: the probability of execution occurring, the probability of infection occurring, and the probability of propagation occurring. One type of analysis is required to handle each part of the fault/failure model. Each of these analyses is examined, and the interpretation of the resulting three sets of probability estimates for each location is discussed. The relationship of the approach to testability is considered.<>
  • Keywords
    probability; program testing; sensitivity analysis; execution; failure-causing fault; fault location; fault/failure model; infection; probability estimates; program location; propagation; sensitivity analysis; testability; Educational institutions; NASA; Performance evaluation; Software testing;
  • fLanguage
    English
  • Journal_Title
    Software, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7459
  • Type

    jour

  • DOI
    10.1109/52.73748
  • Filename
    73748