DocumentCode
1458096
Title
Predicting where faults can hide from testing
Author
Voas, Jeffrey ; Morell, Larry ; Miller, Keith
Author_Institution
NASA Langley Res. Center, Hampton, VA, USA
Volume
8
Issue
2
fYear
1991
fDate
3/1/1991 12:00:00 AM
Firstpage
41
Lastpage
48
Abstract
Sensitivity analysis, which estimates the probability that a program location can hide a failure-causing fault, is addressed. The concept of sensitivity is discussed, and a fault/failure model that accounts for fault location is presented. Sensitivity analysis requires that every location be analyzed for three properties: the probability of execution occurring, the probability of infection occurring, and the probability of propagation occurring. One type of analysis is required to handle each part of the fault/failure model. Each of these analyses is examined, and the interpretation of the resulting three sets of probability estimates for each location is discussed. The relationship of the approach to testability is considered.<>
Keywords
probability; program testing; sensitivity analysis; execution; failure-causing fault; fault location; fault/failure model; infection; probability estimates; program location; propagation; sensitivity analysis; testability; Educational institutions; NASA; Performance evaluation; Software testing;
fLanguage
English
Journal_Title
Software, IEEE
Publisher
ieee
ISSN
0740-7459
Type
jour
DOI
10.1109/52.73748
Filename
73748
Link To Document