DocumentCode :
1458096
Title :
Predicting where faults can hide from testing
Author :
Voas, Jeffrey ; Morell, Larry ; Miller, Keith
Author_Institution :
NASA Langley Res. Center, Hampton, VA, USA
Volume :
8
Issue :
2
fYear :
1991
fDate :
3/1/1991 12:00:00 AM
Firstpage :
41
Lastpage :
48
Abstract :
Sensitivity analysis, which estimates the probability that a program location can hide a failure-causing fault, is addressed. The concept of sensitivity is discussed, and a fault/failure model that accounts for fault location is presented. Sensitivity analysis requires that every location be analyzed for three properties: the probability of execution occurring, the probability of infection occurring, and the probability of propagation occurring. One type of analysis is required to handle each part of the fault/failure model. Each of these analyses is examined, and the interpretation of the resulting three sets of probability estimates for each location is discussed. The relationship of the approach to testability is considered.<>
Keywords :
probability; program testing; sensitivity analysis; execution; failure-causing fault; fault location; fault/failure model; infection; probability estimates; program location; propagation; sensitivity analysis; testability; Educational institutions; NASA; Performance evaluation; Software testing;
fLanguage :
English
Journal_Title :
Software, IEEE
Publisher :
ieee
ISSN :
0740-7459
Type :
jour
DOI :
10.1109/52.73748
Filename :
73748
Link To Document :
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