DocumentCode :
1458133
Title :
The response of different copper alloys as rail contacts at the breech of an electromagnetic launcher
Author :
Gee, R.M. ; Persad, Chadee
Author_Institution :
Inst. for Adv. Technol., Texas Univ., Austin, TX, USA
Volume :
37
Issue :
1
fYear :
2001
fDate :
1/1/2001 12:00:00 AM
Firstpage :
263
Lastpage :
268
Abstract :
Current flow through the breech region of the rail conductor produces the longest exposure to Joule heating for any location in a simple electromagnetic launcher (EML) bore. Movement of a solid, stationary armature occurs when electromagnetic propulsion forces exceed frictional and mechanical loading forces imposed at start-up. Consequently, the armature dwells at this “footprint” for an extended thermal cycle longer than any subsequently traversed location. The authors report results of four copper alloy specimens (Be-Cu, Cu-Cr, Cu-W, DS Cu) placed as removable tiles near the breech of a medium caliber EML. Specimen performance in single or multiple launch tests is evaluated by strength, hardness, electrical and thermal conductivity properties. Muzzle voltage traces are used to fingerprint the electrical performance for peak currents exceeding 900 kA. The materials are evaluated by optical microscopy for changes in microstructure and hardness, and by optical profilometry for surface damage that could affect long term performance
Keywords :
copper alloys; electrical contacts; electromagnetic launchers; materials testing; thermal analysis; Be-Cu; Cu; Cu-Cr; Cu-W; Joule heating; current flow; electrical conductivity; electromagnetic launcher breech; electromagnetic propulsion forces; extended thermal cycle footprint; hardness; microstructure; muzzle voltage traces; optical microscopy; optical profilometry; rail contacts; solid stationary armature; specimen performance; strength; surface damage; thermal conductivity; Boring; Conductors; Copper alloys; Electromagnetic forces; Electromagnetic heating; Electromagnetic launching; Optical microscopy; Rails; Solids; Thermal conductivity;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/20.911834
Filename :
911834
Link To Document :
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