• DocumentCode
    145816
  • Title

    Improving sensitivity and defying residual stress in MEMS bi-material terahertz sensors with metamaterial structures and self-leveling configuration

  • Author

    Alves, F. ; Grbovic, D. ; Arruda, J. ; Santos, Ricardo ; Karunasiri, G.

  • Author_Institution
    Dept. of Phys., Naval Postgrad. Sch., Monterey, CA, USA
  • fYear
    2014
  • fDate
    25-28 Aug. 2014
  • Firstpage
    10
  • Lastpage
    12
  • Abstract
    In this paper we report on techniques to improve sensitivity and reduce the residual stress and its effects on THz MEMS bi-material sensors, using metamaterial structures and self-leveling configurations. Structural metamaterial films made of aluminum and silicon-rich silicon oxide bring the THz absorption close to 100% while making the absorption area relatively flat. Multi-folded bi-material and thermal insulating legs compensate the residual stress of the films, leveling the sensors, making them attractive to be used in THz imaging systems with external optical readout.
  • Keywords
    internal stresses; microsensors; terahertz metamaterials; terahertz wave detectors; THz MEMS bimaterial sensors; THz absorption; THz imaging systems; aluminum; external optical readout; metamaterial structures; multifolded bimaterial; residual stress; self-leveling configurations; silicon-rich silicon oxide; structural metamaterial films; thermal insulating legs; Absorption; Films; Metamaterials; Optical sensors; Stress;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Electromagnetic Materials in Microwaves and Optics (METAMATERIALS), 2014 8th International Congress on
  • Conference_Location
    Lyngby
  • Print_ISBN
    978-1-4799-3450-8
  • Type

    conf

  • DOI
    10.1109/MetaMaterials.2014.6948615
  • Filename
    6948615