DocumentCode :
145816
Title :
Improving sensitivity and defying residual stress in MEMS bi-material terahertz sensors with metamaterial structures and self-leveling configuration
Author :
Alves, F. ; Grbovic, D. ; Arruda, J. ; Santos, Ricardo ; Karunasiri, G.
Author_Institution :
Dept. of Phys., Naval Postgrad. Sch., Monterey, CA, USA
fYear :
2014
fDate :
25-28 Aug. 2014
Firstpage :
10
Lastpage :
12
Abstract :
In this paper we report on techniques to improve sensitivity and reduce the residual stress and its effects on THz MEMS bi-material sensors, using metamaterial structures and self-leveling configurations. Structural metamaterial films made of aluminum and silicon-rich silicon oxide bring the THz absorption close to 100% while making the absorption area relatively flat. Multi-folded bi-material and thermal insulating legs compensate the residual stress of the films, leveling the sensors, making them attractive to be used in THz imaging systems with external optical readout.
Keywords :
internal stresses; microsensors; terahertz metamaterials; terahertz wave detectors; THz MEMS bimaterial sensors; THz absorption; THz imaging systems; aluminum; external optical readout; metamaterial structures; multifolded bimaterial; residual stress; self-leveling configurations; silicon-rich silicon oxide; structural metamaterial films; thermal insulating legs; Absorption; Films; Metamaterials; Optical sensors; Stress;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Advanced Electromagnetic Materials in Microwaves and Optics (METAMATERIALS), 2014 8th International Congress on
Conference_Location :
Lyngby
Print_ISBN :
978-1-4799-3450-8
Type :
conf
DOI :
10.1109/MetaMaterials.2014.6948615
Filename :
6948615
Link To Document :
بازگشت