DocumentCode
145816
Title
Improving sensitivity and defying residual stress in MEMS bi-material terahertz sensors with metamaterial structures and self-leveling configuration
Author
Alves, F. ; Grbovic, D. ; Arruda, J. ; Santos, Ricardo ; Karunasiri, G.
Author_Institution
Dept. of Phys., Naval Postgrad. Sch., Monterey, CA, USA
fYear
2014
fDate
25-28 Aug. 2014
Firstpage
10
Lastpage
12
Abstract
In this paper we report on techniques to improve sensitivity and reduce the residual stress and its effects on THz MEMS bi-material sensors, using metamaterial structures and self-leveling configurations. Structural metamaterial films made of aluminum and silicon-rich silicon oxide bring the THz absorption close to 100% while making the absorption area relatively flat. Multi-folded bi-material and thermal insulating legs compensate the residual stress of the films, leveling the sensors, making them attractive to be used in THz imaging systems with external optical readout.
Keywords
internal stresses; microsensors; terahertz metamaterials; terahertz wave detectors; THz MEMS bimaterial sensors; THz absorption; THz imaging systems; aluminum; external optical readout; metamaterial structures; multifolded bimaterial; residual stress; self-leveling configurations; silicon-rich silicon oxide; structural metamaterial films; thermal insulating legs; Absorption; Films; Metamaterials; Optical sensors; Stress;
fLanguage
English
Publisher
ieee
Conference_Titel
Advanced Electromagnetic Materials in Microwaves and Optics (METAMATERIALS), 2014 8th International Congress on
Conference_Location
Lyngby
Print_ISBN
978-1-4799-3450-8
Type
conf
DOI
10.1109/MetaMaterials.2014.6948615
Filename
6948615
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