• DocumentCode
    1458366
  • Title

    Light activated semiconductors for ETC pulsed power applications

  • Author

    Wisken, Holger G. ; Podeyn, Frank ; Weise, Thömas H G G ; Dorn, Jörg ; Westerholt, Dirk

  • Author_Institution
    TZN Forschungs und Entwicklungszentrum Unterluess GmbH, Unterluess, Germany
  • Volume
    37
  • Issue
    1
  • fYear
    2001
  • fDate
    1/1/2001 12:00:00 AM
  • Firstpage
    403
  • Lastpage
    405
  • Abstract
    The integration of a capacitive pulsed power supply system into a combat fighting vehicle with ETC weaponization requires the development of compact PPS modules with a high reliability of their energy storage and pulse forming components. To fulfill these requirements a variety of switch technologies have been investigated for many years. This paper gives first results of the investigations on a new type of a semiconducting switch which is activated directly by an optical trigger input. The attractiveness of this switch is its lower trigger power requirement, its compact set-up, and its high reliability. Integrated breakdown diodes prevent the switch from a damage in case of a malfunction of the trigger system of one wafer. A high voltage set-up of this switch technology was tested under ETC conditions. The paper presents the test set-up as well as the results obtained from the experiments. In the conclusion of the paper, the impacts of this switch technology on the development of future ETC gun PPS modules is discussed
  • Keywords
    electrothermal launchers; energy storage; military equipment; power capacitors; pulsed power supplies; pulsed power switches; thyristors; weapons; ETC conditions; capacitive pulsed power supply system; combat fighting vehicle; electrothermal-chemical launchers; energy storage; integrated breakdown diodes; light activated semiconductors; optical trigger input; pulse forming components; pulsed power applications; semiconducting switch; switch technologies; Energy storage; Optical pulses; Optical switches; Power semiconductor switches; Power system reliability; Pulsed power supplies; Semiconductivity; Testing; Vehicles; Weapons;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.911864
  • Filename
    911864