Title :
Property Learning Techniques for Efficient Generation of Directed Tests
Author :
Chen, Mingsong ; Mishra, Prabhat
Author_Institution :
Software Eng. Inst., East China Normal Univ., Shanghai, China
fDate :
6/1/2011 12:00:00 AM
Abstract :
Property falsification in model checking is widely used for automated generation of directed tests. Due to state space explosion problem, traditional model checking techniques cannot handle large scale designs. SAT-based bounded model checking is promising to address the prohibitively large time and resource requirements during the property falsification. This article presents several efficient learning techniques that can improve the overall test generation time for a single property as well as a cluster of similar properties. The goal is to exploit both variable assignments and common conflict clauses of the prechecked partial or similar SAT instances for property falsification. Our method makes three novel contributions: 1) investigates the decision ordering-based learnings for a single SAT instance; 2) applies the decision ordering learnings between similar SAT instances; and 3) exploits the relation between the decision ordering-based learning and conflict clauses-based learning. Our experimental results using both software and hardware benchmarks demonstrate that our approach can drastically reduce the overall test generation time.
Keywords :
computability; formal verification; SAT instances; SAT-based bounded model checking; automated generation; conflict clauses-based learning; decision ordering learnings; decision ordering-based learnings; directed tests; efficient generation; efficient learning techniques; large scale designs; overall test generation time; property falsification; property learning; resource requirements; state space explosion problem; Boolean functions; Computational modeling; Correlation; Data structures; Hardware; Software; Testing; Bounded model checking; conflict clause forwarding; decision ordering.; directed test generation;
Journal_Title :
Computers, IEEE Transactions on