DocumentCode :
1458605
Title :
Thinned stepped frequency waveforms to furnish existing radars with imaging capability
Author :
Freedman, Avraham ; Bose, Ranjan ; Steinberg, Bernard D.
Author_Institution :
Moore Sch. of Electr. Eng., Pennsylvania Univ., Philadelphia, PA, USA
Volume :
11
Issue :
11
fYear :
1996
fDate :
11/1/1996 12:00:00 AM
Firstpage :
39
Lastpage :
43
Abstract :
Introducing imaging capability to an existing radar, even if it is a high RF bandwidth radar, may be difficult, due to limitations on the IF bandwidth, limitations on the pulse repetition frequency and electromagnetic compatibility problems. This paper discusses the use of thinned stepped frequency waveforms, which enable the radar to switch between RF frequencies to provide a synthesized wide RF bandwidth, while the thinning may alleviate some of the constraints imposed on the radar. Random and periodic thinning are discussed in the first part of this paper. However, thinning may cause degradation in image quality, thus an additional technique-Sequence CLEAN deconvolution-is suggested. Sequence CLEAN is an iterative deconvolution algorithm, adopted from the field of radioastronomy, which is capable of resolving close targets in a dense environment, where the system response is heavily affected by high sidelobes
Keywords :
deconvolution; electromagnetic compatibility; iterative methods; radar imaging; radar theory; waveform analysis; IF bandwidth; RF frequencies; S-CLEAN; close targets; degradation; dense environment; electromagnetic compatibility; high RF bandwidth radar; high sidelobes; image quality; iterative deconvolution algorithm; periodic thinning; pulse repetition frequency; radioastronomy; random; synthesized wide RF bandwidth; thinned stepped frequency waveforms; Bandwidth; Deconvolution; Degradation; EMP radiation effects; Electromagnetic compatibility; Frequency synthesizers; Image quality; Radar imaging; Radio frequency; Switches;
fLanguage :
English
Journal_Title :
Aerospace and Electronic Systems Magazine, IEEE
Publisher :
ieee
ISSN :
0885-8985
Type :
jour
DOI :
10.1109/62.544025
Filename :
544025
Link To Document :
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