• DocumentCode
    1458733
  • Title

    Test forensics: A guide to evaluating TPS transportability

  • Author

    Wegener, Steven A.

  • Author_Institution
    Boeing Co., St. Louis, MO, USA
  • Volume
    26
  • Issue
    1
  • fYear
    2011
  • Firstpage
    29
  • Lastpage
    34
  • Abstract
    Test forensics is a systematic approach for evaluating execution results of a Unit Under Test (UUT) over a broad set of criterion. Execution results include the traditional test numbers, measured values and limits, but also include timing relationships and configuration information about the UUT and Automatic Test Equipment (ATE) used while conducting the test. Occasionally a test may pass on Station A but fail on Station B, even though both stations are identical, and manufactured from the same production line. Finding the root cause of this type of failure is often tedious and time-consuming. The complexity of solving this issue increases significantly if Station B is a replacement for Station A, containing a different hardware and software architecture, subject only to the requirement of being functionally equivalent. For either the production case or the transportability case, engineering could benefit from automated tools and data collection. Presented herein is an approach for collecting data from the early stages of compilation and translation of a test program set (TPS) all the way through TPS execution on the ATE. Test forensics is a design approach of the runtime system coupled with automated tools for analyzing and presenting the data to the operator. This will briefly touch on how the test-forensics implementation would benefit net-centric and distributive network efforts to achieve TPS transportability.
  • Keywords
    automatic test equipment; TPS transportability; automatic test equipment; test forensics; test program set; unit under test; Automatic test equipment; Forensics; Performance evaluation; Testing;
  • fLanguage
    English
  • Journal_Title
    Aerospace and Electronic Systems Magazine, IEEE
  • Publisher
    ieee
  • ISSN
    0885-8985
  • Type

    jour

  • DOI
    10.1109/MAES.2011.5719653
  • Filename
    5719653