• DocumentCode
    1458740
  • Title

    What can we do to stay current with technology?

  • Author

    Kirkland, Larry V.

  • Author_Institution
    Wes Test Engineering, 810 Shepard Lane, Farmington, UT 84025, USA
  • Volume
    26
  • Issue
    1
  • fYear
    2011
  • Firstpage
    35
  • Lastpage
    39
  • Abstract
    We need to focus on the exact cause of failure and perform prognostics during the test and repair cycle. Technology must change for test/diagnosis. With the advent of more robust microcircuits, we need to think “outside-the-box” when it comes to testing. If we continue to perform diagnostics in the same manner, without considering other testing philosophies, we will continue to waste time and resources.
  • Keywords
    automatic test equipment; maintenance engineering; prognostics; robust microcircuits; test-diagnosis; testing philosophy; Maintenance engineering; Robustness; Technological innovation; Testing;
  • fLanguage
    English
  • Journal_Title
    Aerospace and Electronic Systems Magazine, IEEE
  • Publisher
    ieee
  • ISSN
    0885-8985
  • Type

    jour

  • DOI
    10.1109/MAES.2011.5719654
  • Filename
    5719654
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1458740