Title :
What can we do to stay current with technology?
Author :
Kirkland, Larry V.
Author_Institution :
Wes Test Engineering, 810 Shepard Lane, Farmington, UT 84025, USA
Abstract :
We need to focus on the exact cause of failure and perform prognostics during the test and repair cycle. Technology must change for test/diagnosis. With the advent of more robust microcircuits, we need to think “outside-the-box” when it comes to testing. If we continue to perform diagnostics in the same manner, without considering other testing philosophies, we will continue to waste time and resources.
Keywords :
automatic test equipment; maintenance engineering; prognostics; robust microcircuits; test-diagnosis; testing philosophy; Maintenance engineering; Robustness; Technological innovation; Testing;
Journal_Title :
Aerospace and Electronic Systems Magazine, IEEE
DOI :
10.1109/MAES.2011.5719654
