Optimal ramp edge detection using expansion matching

Author

Wang, Zhiqian ; Rao, K. Raghunath ; Ben-Arie, Jezekiel

Author_Institution

Dept. of Electr. & Comput. Eng., Illinois Inst. of Technol., Chicago, IL, USA

Volume

18

Issue

11

fYear

1996

fDate

11/1/1996 12:00:00 AM

Firstpage

1092

Lastpage

1097

Abstract

In practical images, ideal step edges are actually transformed into ramp edges, due to the general low pass filtering nature of imaging systems. This paper discusses the application of the expansion matching (EXM) method for optimal ramp edge detection. EXM optimizes a novel matching criterion called discriminative signal-to-noise ratio (DSNR) and has been shown to robustly recognize templates under conditions of noise, severe occlusion, and superposition. We show that our ramp edge detector performs better than the ramp detector obtained from Canny´s criteria in terms of DSNR and is relatively easier to derive for various noise levels and slopes

Keywords

edge detection; filtering theory; low-pass filters; Canny´s criteria; discriminative signal-to-noise ratio; expansion matching; ideal step edges; imaging systems; low pass filtering; optimal ramp edge detection; severe occlusion; superposition; Detectors; Filtering; IIR filters; Image edge detection; Low pass filters; Matched filters; Noise level; Optical filters; Optical imaging; Signal to noise ratio;

fLanguage

English

Journal_Title

Pattern Analysis and Machine Intelligence, IEEE Transactions on

Publisher

ieee

ISSN

0162-8828

Type

jour

DOI

10.1109/34.544078

Filename

544078