Title :
A unified analytical expression for aliasing error probability using single-input external- and internal-XOR LFSR
Author :
Elsaholy, Mahmoud S. ; Shaheen, Samir I. ; Seireg, Reda H.
Author_Institution :
Higher Technol. Inst., Tenth of Ramadan City, Egypt
fDate :
12/1/1998 12:00:00 AM
Abstract :
In this paper, an exact unified analytical expression for the transient (and the steady state) behavior of the Aliasing Error Probability (AEP) of signature analysis testing using single-input external- and internal-XOR LFSR is deduced. The expression, contrary to what is known in the literature, uses the leftmost bit of the LFSR
Keywords :
error statistics; logic testing; shift registers; LFSR; aliasing error probability; digital testing; error probability; linear feedback shift register; signature analysis testing; unified analytical expression; Circuit faults; Circuit testing; Error probability; Linear feedback shift registers; Manufacturing; Pattern analysis; Polynomials; Steady-state; Transient analysis; Very large scale integration;
Journal_Title :
Computers, IEEE Transactions on
