• DocumentCode
    1459654
  • Title

    Detection–Estimation of Very Close Emitters: Performance Breakdown, Ambiguity, and General Statistical Analysis of Maximum-Likelihood Estimation

  • Author

    Abramovich, Yuri I. ; Johnson, Ben A.

  • Author_Institution
    Intell., Surveillance, & Reconnaissance Div., Defence Sci. & Technol. Organ. (DSTO), Edinburgh, SA, Australia
  • Volume
    58
  • Issue
    7
  • fYear
    2010
  • fDate
    7/1/2010 12:00:00 AM
  • Firstpage
    3647
  • Lastpage
    3660
  • Abstract
    We reexamine the well-known problem of “threshold behavior” or “performance breakdown” in the detection-estimation of very closely spaced emitters. In this extreme regime, we analyze the performance for maximum-likelihood estimation (MLE) of directions-of-arrival (DOA) for two close Gaussian sources over the range of sample volumes and signal-to-noise ratios (SNRs) where the correct number of sources is reliably estimated by information-theoretic criteria (ITC), but where one of the DOA estimates is severely erroneous (“outlier”). We show that random matrix theory (RMT) applied to the evaluation of theoretical MLE performance gives a relatively simple and accurate analytical description of the threshold behavior of MLE and ITC. In particular, the introduced “single-cluster” criterion provides accurate “ambiguity bounds” for the outliers.
  • Keywords
    direction-of-arrival estimation; matrix algebra; maximum likelihood estimation; signal processing; ambiguity bounds; detection-estimation; directions-of-arrival; general statistical analysis; information-theoretic criteria; maximum-likelihood estimation; performance breakdown; random matrix theory; signal-to-noise ratios; single-cluster criterion; threshold behavior; two close Gaussian sources; very close emitters; Direction-of-arrival (DOA) estimation; maximum-likelihood estimation; random matrix theory; signal detection; signal resolution;
  • fLanguage
    English
  • Journal_Title
    Signal Processing, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1053-587X
  • Type

    jour

  • DOI
    10.1109/TSP.2010.2047334
  • Filename
    5440939