DocumentCode :
1460167
Title :
Nondestructive testing of insulation
Author :
Brancato, E. L.
Author_Institution :
Naval Research Laboratory, Washington, D. C.
Volume :
72
Issue :
5
fYear :
1953
fDate :
5/1/1953 12:00:00 AM
Firstpage :
425
Lastpage :
425
Abstract :
THE USER OF ELECTRIC APPARATUS is constantly in need of information concerning the condition of insulation. This information, at the present time, is supplied by such tests as insulation resistance, power factor, capacitance, or by more severe tests such as “high-pot.” Unfortunately, none of these tests gives a true indication of the “health” of the dielectric, but rather indicate its present condition — a condition that may exist only temporarily and can be corrected by suitable action. It is important, of course, to have this information; however, it is of equal importance in many applications to have an indication of the useful life that can be expected from the dielectric at any time during its use.
Keywords :
Aging; Dielectric losses; Dielectric measurements; Insulation; Resistance; Temperature;
fLanguage :
English
Journal_Title :
Electrical Engineering
Publisher :
ieee
ISSN :
0095-9197
Type :
jour
DOI :
10.1109/EE.1953.6438660
Filename :
6438660
Link To Document :
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