DocumentCode :
146023
Title :
InGaAs inversion layers band structure, electrostatics, and mobility modeling based on 8 Band k · p theory
Author :
Pham, A.-T. ; Jin, Seongwook ; Choi, Wan ; Lee, M.J. ; Cho, SeongHwan ; Kim, Y.-T. ; Lee, Ko-Hsin ; Park, Yu-Seop
Author_Institution :
Samsung Semicond., Inc., San Jose, CA, USA
fYear :
2014
fDate :
22-26 Sept. 2014
Firstpage :
114
Lastpage :
117
Abstract :
8 band k · p method is used to calculate subband structures of InGaAs inversion layers accounting for strong coupling between conduction and valence bands around Γ point as well as quantum confinement. Inversion layer mobility is computed employing Kubo-Greenwood formalism. Scatterings due to acoustic phonons, polar optical phonons, ionized impurities, interface fixed charges, surface roughness, and alloy disorder are included. The simulated low-field electron mobility results are in good agreement with in-house experimental data with and without an InP capping layer.
Keywords :
III-V semiconductors; carrier mobility; gallium arsenide; indium compounds; inversion layers; scattering; 8 band k · p theory; InGaAs; InGaAs inversion layers; InP; InP capping layer; Kubo-Greenwood formalism; acoustic phonons; alloy disorder; conduction bands; interface fixed charges; inversion layer mobility; ionized impurities; polar optical phonons; quantum confinement; scatterings; simulated low-field electron mobility; subband structures; surface roughness; valence bands; Couplings; Indium gallium arsenide; Indium phosphide; Logic gates; MOS devices; Phonons; Scattering;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid State Device Research Conference (ESSDERC), 2014 44th European
Conference_Location :
Venice
ISSN :
1930-8876
Print_ISBN :
978-1-4799-4378-4
Type :
conf
DOI :
10.1109/ESSDERC.2014.6948771
Filename :
6948771
Link To Document :
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