DocumentCode :
146033
Title :
Integrated 4H-silicon carbide diode bridge rectifier for high temperature (773 K) environment
Author :
Shiqian Shao ; Wei-Cheng Lien ; Maralani, Ayden ; Pisano, Albert P.
Author_Institution :
Dept. of Mech. Eng., Univ. of California at Berkeley, Berkeley, CA, USA
fYear :
2014
fDate :
22-26 Sept. 2014
Firstpage :
138
Lastpage :
141
Abstract :
In this paper, we demonstrate the stable operation of integrated 4H-silicon carbide (SiC) diode bridge rectifier circuits at high temperature up to 773 K for the first time. The turn-on voltages of the fabricated 4H-SiC pn diode are 2.6 V and 1.4 V at room temperature and 773 K, respectively, with a low shifting rate of 2.2 mV/K. The integration of the 4H-SiC diode bridge rectifier circuit was achieved with contact and interconnect metallization technique for high temperature. The demonstration of the extremely high temperature operation of the integrated 4H-SiC diode bridge rectifier circuits brings promising applications in harsh environment electronics and sensing.
Keywords :
bridge circuits; rectifiers; semiconductor device metallisation; semiconductor diodes; silicon compounds; wide band gap semiconductors; 4H-SiC pn diode; SiC; contact metallization technique; harsh environment electronics; integrated 4H-silicon carbide diode bridge rectifier circuits; interconnect metallization technique; temperature 293 K to 298 K; temperature 773 K; turn-on voltages; voltage 1.4 V; voltage 2.6 V; Bridge circuits; Fabrication; Plasma temperature; Rectifiers; Silicon carbide; Temperature measurement; Temperature sensors; 4H-SiC pn diode; High temperature; Integrated diode bridge circuit; Rectifier;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid State Device Research Conference (ESSDERC), 2014 44th European
Conference_Location :
Venice
ISSN :
1930-8876
Print_ISBN :
978-1-4799-4378-4
Type :
conf
DOI :
10.1109/ESSDERC.2014.6948777
Filename :
6948777
Link To Document :
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