DocumentCode :
1460557
Title :
Benchmarking semiconductor manufacturing performance using a pairwise-comparison method
Author :
Saeed, B.I.
Volume :
10
Issue :
2
fYear :
1997
fDate :
5/1/1997 12:00:00 AM
Firstpage :
317
Lastpage :
321
Abstract :
Benchmarking performance against competitors is an increasingly popular activity within the semiconductor industry. Owing to the high variability in manufacturing metrics, a simple monthly metric score is usually insufficient to accurately benchmark performance. However, in the rapidly changing semiconductor world, data which are one to two years old may be irrelevant to the current situation. We propose a simple ranking method based on a method of paired-comparisons for unbalanced data which gives a good ranking and is also reliable under fluctuations in the data. Using semiconductor manufacturing performance data from the Competitive Semiconductor Manufacturing Study at the University of California at Berkeley, we give an example of this method and compare its reliability and accuracy against other techniques through simulations
Keywords :
integrated circuit manufacture; semiconductor device manufacture; simulation; statistical analysis; manufacturing metrics; manufacturing performance data; pairwise-comparison method; performance benchmarking; ranking method; semiconductor industry; semiconductor manufacturing performance; Electronics industry; Fabrication; Fluctuations; Industrial engineering; Operations research; Semiconductor device manufacture; Semiconductor device reliability; Steady-state; Throughput; Virtual manufacturing;
fLanguage :
English
Journal_Title :
Semiconductor Manufacturing, IEEE Transactions on
Publisher :
ieee
ISSN :
0894-6507
Type :
jour
DOI :
10.1109/66.572087
Filename :
572087
Link To Document :
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