• DocumentCode
    1460675
  • Title

    Integrated Optical Pressure Sensors in Silicon-on-Insulator

  • Author

    Hallynck, E. ; Bienstman, P.

  • Author_Institution
    Dept. of Inf. Technol., Photonics Res. Group, Ghent Univ. - IMEC, Ghent, Belgium
  • Volume
    4
  • Issue
    2
  • fYear
    2012
  • fDate
    4/1/2012 12:00:00 AM
  • Firstpage
    443
  • Lastpage
    450
  • Abstract
    An optical pressure sensor can be useful in many applications where electronics fall short (e.g., explosive environments). We have fabricated and characterized compact, integrated optical pressure sensors on a silicon-on-insulator platform using ring resonators and Mach-Zehnder interferometers. The silicon substrate is locally etched using KOH to produce very thin membranes of 3.28 μm. Measurements have shown that spectral features in our devices can shift up to 370 pm going from 0 to 80 kPa.
  • Keywords
    Mach-Zehnder interferometers; integrated optics; optical fabrication; optical resonators; optical sensors; pressure sensors; silicon-on-insulator; KOH; Mach-Zehnder interferometers; Si; integrated optical pressure sensors; pressure 0 kPa to 80 kPa; ring resonators; silicon-on-insulator platform; size 3.28 mum; spectral features; Optical device fabrication; Optical interferometry; Optical ring resonators; Optical sensors; Silicon; Stress; Nanophotonics; optoelectronic and photonic sensor; photonic integrated circuits;
  • fLanguage
    English
  • Journal_Title
    Photonics Journal, IEEE
  • Publisher
    ieee
  • ISSN
    1943-0655
  • Type

    jour

  • DOI
    10.1109/JPHOT.2012.2189614
  • Filename
    6161682