Title :
Guest editor´s introduction to special section on high-level design validation and test
Author_Institution :
Polytechnic University
fDate :
3/1/2001 12:00:00 AM
Keywords :
Automatic testing; Built-in self-test; Circuit testing; Conferences; Electrical equipment industry; Emulation; Microprocessors; Software testing; System testing; Very large scale integration;
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
DOI :
10.1109/TCAD.2001.913753
