Title :
System-on-a-chip test-data compression and decompression architectures based on Golomb codes
Author :
Chandra, Anshuman ; Chakrabarty, Krishnendu
Author_Institution :
Dept. of Electr. & Comput. Eng., Duke Univ., Durham, NC, USA
fDate :
3/1/2001 12:00:00 AM
Abstract :
We present a new test-data compression method and decompression architecture based on variable-to-variable-length Golomb codes. The proposed method is especially suitable for encoding precomputed test sets for embedded cores in a system-on-a-chip (SoC). The major advantages of Golomb coding of test data include very high compression, analytically predictable compression results, and a low-cost and scalable on-chip decoder. In addition, the novel interleaving decompression architecture allows multiple cores in an SoC to be tested concurrently using a single automatic test equipment input-output channel. We demonstrate the effectiveness of the proposed approach by applying it to the International Symposium on Circuits and Systems´ benchmark circuits and to two industrial production circuits. We also use analytical and experimental means to highlight the superiority of Golomb codes over run-length codes
Keywords :
automatic test equipment; data compression; integrated circuit testing; variable length codes; automatic test equipment; data compression; data decompression; embedded core; input-output channel; interleaving architecture; system-on-a-chip; variable-to-variable-length Golomb code; Automatic test equipment; Automatic testing; Benchmark testing; Circuit testing; Circuits and systems; Decoding; Interleaved codes; Production systems; System testing; System-on-a-chip;
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on