DocumentCode :
146116
Title :
Size-dependent electron mobility in InAs nanowires
Author :
Marin, Enrique G. ; Ruiz, Francisco G. ; Godoy, Andres ; Tienda-Luna, Isabel M. ; Gamiz, Francisco
Author_Institution :
Dipt. de Electron. y Tecnol. de Comput., Univ. de Granada, Granada, Spain
fYear :
2014
fDate :
22-26 Sept. 2014
Firstpage :
317
Lastpage :
320
Abstract :
This work studies the electron mobility in InAs nanowires, taking into account the contribution of the main scattering mechanisms that determine its behavior. Moreover, we analyze its dependence on the nanowire diameter, carrier density and population of the Γ, L and X valleys. It is found that surface roughness and polar optical phonons are the scattering mechanisms that mainly limit the mobility behavior. We also show that the electron mobility of the L valleys is much lower than the one of the Γ valley, because of the higher conduction effective mass. The combination of the higher population of the L valleys and the stronger impact of the surface roughness scattering degrades the characteristic high mobility of InAs as the nanowire diameter decreases.
Keywords :
III-V semiconductors; electrical conductivity; electron density; electron mobility; indium compounds; phonons; surface roughness; surface scattering; InAs; L valleys; carrier density; effective mass; nanowires; polar optical phonons; scattering mechanisms; size-dependent electron mobility; surface roughness; Electron mobility; Logic gates; Nanowires; Nickel; Scattering; Sociology; Statistics;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid State Device Research Conference (ESSDERC), 2014 44th European
Conference_Location :
Venice
ISSN :
1930-8876
Print_ISBN :
978-1-4799-4378-4
Type :
conf
DOI :
10.1109/ESSDERC.2014.6948824
Filename :
6948824
Link To Document :
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