DocumentCode
146116
Title
Size-dependent electron mobility in InAs nanowires
Author
Marin, Enrique G. ; Ruiz, Francisco G. ; Godoy, Andres ; Tienda-Luna, Isabel M. ; Gamiz, Francisco
Author_Institution
Dipt. de Electron. y Tecnol. de Comput., Univ. de Granada, Granada, Spain
fYear
2014
fDate
22-26 Sept. 2014
Firstpage
317
Lastpage
320
Abstract
This work studies the electron mobility in InAs nanowires, taking into account the contribution of the main scattering mechanisms that determine its behavior. Moreover, we analyze its dependence on the nanowire diameter, carrier density and population of the Γ, L and X valleys. It is found that surface roughness and polar optical phonons are the scattering mechanisms that mainly limit the mobility behavior. We also show that the electron mobility of the L valleys is much lower than the one of the Γ valley, because of the higher conduction effective mass. The combination of the higher population of the L valleys and the stronger impact of the surface roughness scattering degrades the characteristic high mobility of InAs as the nanowire diameter decreases.
Keywords
III-V semiconductors; electrical conductivity; electron density; electron mobility; indium compounds; phonons; surface roughness; surface scattering; InAs; L valleys; carrier density; effective mass; nanowires; polar optical phonons; scattering mechanisms; size-dependent electron mobility; surface roughness; Electron mobility; Logic gates; Nanowires; Nickel; Scattering; Sociology; Statistics;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid State Device Research Conference (ESSDERC), 2014 44th European
Conference_Location
Venice
ISSN
1930-8876
Print_ISBN
978-1-4799-4378-4
Type
conf
DOI
10.1109/ESSDERC.2014.6948824
Filename
6948824
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