• DocumentCode
    1461266
  • Title

    Built-in self-test: assuring system integrity

  • Author

    Könemann, Bernd ; Bennetts, Ben ; Jarwala, Najmi ; Nadeau-Dostie, Benoit

  • Author_Institution
    LogicVision, San Jose, CA, USA
  • Volume
    29
  • Issue
    11
  • fYear
    1996
  • fDate
    11/1/1996 12:00:00 AM
  • Firstpage
    39
  • Lastpage
    45
  • Abstract
    Today´s complex electronic products are harder to test using traditional external methods. Built in self test can frequently be used without significantly increasing a product´s size, cost and production time
  • Keywords
    built-in self test; integrated circuit manufacture; integrated circuit testing; integrated circuits; quality control; built in self test; complex electronic products; cost; product size; production time; system integrity assurance; Automatic testing; Built-in self-test; Circuit testing; Costs; Electronic equipment testing; Life testing; Logic; Probes; Production; System testing;
  • fLanguage
    English
  • Journal_Title
    Computer
  • Publisher
    ieee
  • ISSN
    0018-9162
  • Type

    jour

  • DOI
    10.1109/2.544236
  • Filename
    544236
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1461266