DocumentCode :
146129
Title :
Impact of discrete dopants on an ultra-scaled FinFET using quantum transport simulations
Author :
Valin, Raul ; Martinez, A. ; Aldegunde, Manuel ; Barker, John R.
Author_Institution :
Coll. of Eng., Swansea Univ., Swansea, UK
fYear :
2014
fDate :
22-26 Sept. 2014
Firstpage :
345
Lastpage :
348
Abstract :
In this paper we study the effect of random discrete dopants in the source/drain on the performance of a 6.6 nm channel length silicon FinFET. Due to the small dimensions of the FinFET, a quantum transport formalism based on the Non-equilibrium Greens Functions has been deployed. The transfer characteristics for several devices, which differ in location and number of dopants have been simulated. Our calculations demonstrated that discrete dopants modify the effective channel length and the height of the source/drain barrier, consequently changing the channel control of the charge. As a consequence, there is a strong effect on the variability of the off-current, sub-threshold slope and threshold voltage. Finally, we have calculated the mean and standard deviation of these parameters to quantify their variability.
Keywords :
Green´s function methods; MOSFET; elemental semiconductors; semiconductor device models; semiconductor doping; silicon; transport processes; Si; discrete dopant impact; nonequilibrium Greens functions; quantum transport simulations; random discrete dopants; semiconductor device variability; size 6.6 nm; source-drain barrier; standard deviation; ultrascaled FinFET; Educational institutions; Electric potential; FinFETs; Green´s function methods; Impurities; Silicon; Threshold voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid State Device Research Conference (ESSDERC), 2014 44th European
Conference_Location :
Venice
ISSN :
1930-8876
Print_ISBN :
978-1-4799-4378-4
Type :
conf
DOI :
10.1109/ESSDERC.2014.6948831
Filename :
6948831
Link To Document :
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