Title :
Cross-channel interference due to mode partition noise in WDM optical systems using self-seeded gain-switched pulse sources
Author :
Barry, L.P. ; Anandarajah, P.
Author_Institution :
Sch. of Electron. Eng., Dublin City Univ., Ireland
fDate :
3/1/2001 12:00:00 AM
Abstract :
The sidemode suppression ratio of self-seeded, gain-switched optical pulses is shown to be a vital parameter in determining the usefulness of these pulses in wavelength-division multiplexed communications systems. Experiments carried out on a two-channel wavelength multiplexed setup using tunable self-seeded gain-switched pulse sources at 10 GHz, have demonstrated the cross-channel interference effects that may be encountered if the sidemode suppression ratio of one of the sources becomes degraded. The sidemode suppression ratio of self-seeded, gainswitched optical pulses is shown to be a vital parameter in determining the usefulness of these pulses in wavelength-division multiplexed communications systems. Experiments carried out on a two-channel wavelength multiplexed setup using tunable self-seeded gain-switched pulse sources at 10 GHz, have demonstrated the cross-channel interference effects that may be encountered if the sidemode suppression ratio of one of the sources becomes degraded.
Keywords :
light interference; optical fibre networks; optical noise; optical tuning; telecommunication channels; wavelength division multiplexing; WDM optical systems; cross-channel interference; cross-channel interference effects; gain-switched optical pulses; gainswitched optical pulses; mode partition noise; self-seeded gain-switched pulse sources; sidemode suppression ratio; tunable self-seeded gain-switched pulse sources; two-channel wavelength multiplexed setup; wavelength-division multiplexed communications systems; Interference; Laser modes; Laser tuning; Optical feedback; Optical filters; Optical noise; Optical pulse generation; Optical pulses; Semiconductor device noise; Wavelength division multiplexing;
Journal_Title :
Photonics Technology Letters, IEEE