DocumentCode
1461596
Title
Microstructure and Magnetic Properties of In-Situ Deposited
FePt Films on MgO(200) Films of Varying Thicknesses
Author
Chen, S.C. ; Sun, T.H. ; Shen, C.L. ; Peng, W.C. ; Chen, C.D. ; Kuo, P.C. ; Chen, J.R.
Author_Institution
Dept. of Mater. Eng., Ming Chi Univ. of Technol., Taipei, Taiwan
Volume
47
Issue
3
fYear
2011
fDate
3/1/2011 12:00:00 AM
Firstpage
517
Lastpage
520
Abstract
The FePt(30 nm)/MgO bilayer films with various MgO(200) underlayer thicknesses of 0 to 30 nm are in-situ deposited on Si substrates. A weak (111)FePt peak as well as strong (001)FePt and (002)FePt peaks are observed in XRD pattern of single-layered FePt film with no MgO underlayer. When a 5 nm thick MgO film is introduced under the FePt film, the (111)FePt peak almost disappears and both the (001)FePt and (002)FePt peaks are enhanced greatly. This indicates that the perpendicular magnetic anisotropy of FePt film can be improved by introduction of a thinner MgO underlayer. However, a weak (111)FePt peak appears again as the MgO underlayer is increased to 10 nm, revealing that the perpendicular magnetic anisotropy of FePt film will be deteriorated by introducing a thicker MgO underlayer.
Keywords
X-ray diffraction; coercive force; ferromagnetic materials; iron alloys; magnetic thin films; perpendicular magnetic anisotropy; platinum alloys; sputter deposition; FePt-MgO-Si; MgO(200) films; Si; XRD; bilayer films; coercivity; magnetic properties; microstructure; perpendicular magnetic anisotropy; size 0 nm to 30 nm; Magnetic domains; Magnetic properties; Perpendicular magnetic anisotropy; Perpendicular magnetic recording; Substrates; FePt/MgO bilayer films; MgO underlayer; in-situ deposited; magnetic properties; perpendicular magnetic anisotropy;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/TMAG.2011.2104355
Filename
5721807
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