DocumentCode :
1461642
Title :
Transistor noise. Its origin, measurement and behaviour
Author :
Wilson, B.L.H.
Volume :
18
Issue :
4
fYear :
1958
fDate :
4/1/1958 12:00:00 AM
Firstpage :
207
Lastpage :
225
Abstract :
The sources of noise in semi-conductors and the mathematical techniques needed in their discussion are indicated in order to survey the theory of noise in transistor amplifiers and to consider methods of measurement. The variation of transistor noise with operating point and frequency is discussed and a comparison is made of noise levels in audio amplifiers using transistors and valves respectively.
Keywords :
electron device noise; transistors;
fLanguage :
English
Journal_Title :
Radio Engineers, Journal of the British Institution of
Publisher :
iet
Type :
jour
DOI :
10.1049/jbire.1958.0020
Filename :
5259470
Link To Document :
بازگشت