DocumentCode :
1461853
Title :
Design of a Dual-Wavelength Optical Head for Submicron-Scale and Nano-Scale Lithography
Author :
Lee, Yuan-Chin ; Chao, Shiuh ; Huang, Chun-Chieh ; Yang, Chin-Tien
Author_Institution :
Inst. of Photonics Technol., Nat. Tsing Hua Univ., Hsinchu, Taiwan
Volume :
47
Issue :
3
fYear :
2011
fDate :
3/1/2011 12:00:00 AM
Firstpage :
696
Lastpage :
700
Abstract :
Previous research on the utilization of an optical pickup head (OPH) as the source for exposing inorganic photo resists uses only one wavelength. However, these single-wavelength OPHs are not appropriate for exposing organic resists. Because the optical power required for exposing the organic resists is too small to produce large enough focusing error signal (FES). To add another wavelength for the focusing servo is essential to eliminate this problem. This paper presents a design of an OPH with blue and red lasers for submicron-scale and nano-scale lithography. The blue laser is used for exposing the resists, while the red laser is used for the focusing servo. The numerical aperture (NA) of the objective lens is 0.6. And the linear range of the focusing error signal (FES) is about 3.0 . In addition, this paper also discusses the variation of linear range due to fabrication error. Three types of different optical structures in the return path are compared. The simulation results show that the adoption of a plano-convex lens and a slanted beam-splitter (BS) plate is the best choice. This combination owns the best immunity to the variation of the linear range due to the fabrication errors.
Keywords :
lasers; nanolithography; optical beam splitters; photolithography; photoresists; plates (structures); blue laser; dual-wavelength optical head; fabrication error; focusing error signal; nano-scale lithography; numerical aperture; optical structures; plano-convex lens; red laser; slanted beam-splitter plate; submicron-scale lithography; Adaptive optics; Laser beams; Lenses; Optical device fabrication; Optical diffraction; Optical polarization; Resists; Inorganic photo resist; linear range; numerical aperture; optical pickup head;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.2010.2100813
Filename :
5721845
Link To Document :
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