DocumentCode
1461853
Title
Design of a Dual-Wavelength Optical Head for Submicron-Scale and Nano-Scale Lithography
Author
Lee, Yuan-Chin ; Chao, Shiuh ; Huang, Chun-Chieh ; Yang, Chin-Tien
Author_Institution
Inst. of Photonics Technol., Nat. Tsing Hua Univ., Hsinchu, Taiwan
Volume
47
Issue
3
fYear
2011
fDate
3/1/2011 12:00:00 AM
Firstpage
696
Lastpage
700
Abstract
Previous research on the utilization of an optical pickup head (OPH) as the source for exposing inorganic photo resists uses only one wavelength. However, these single-wavelength OPHs are not appropriate for exposing organic resists. Because the optical power required for exposing the organic resists is too small to produce large enough focusing error signal (FES). To add another wavelength for the focusing servo is essential to eliminate this problem. This paper presents a design of an OPH with blue and red lasers for submicron-scale and nano-scale lithography. The blue laser is used for exposing the resists, while the red laser is used for the focusing servo. The numerical aperture (NA) of the objective lens is 0.6. And the linear range of the focusing error signal (FES) is about 3.0 . In addition, this paper also discusses the variation of linear range due to fabrication error. Three types of different optical structures in the return path are compared. The simulation results show that the adoption of a plano-convex lens and a slanted beam-splitter (BS) plate is the best choice. This combination owns the best immunity to the variation of the linear range due to the fabrication errors.
Keywords
lasers; nanolithography; optical beam splitters; photolithography; photoresists; plates (structures); blue laser; dual-wavelength optical head; fabrication error; focusing error signal; nano-scale lithography; numerical aperture; optical structures; plano-convex lens; red laser; slanted beam-splitter plate; submicron-scale lithography; Adaptive optics; Laser beams; Lenses; Optical device fabrication; Optical diffraction; Optical polarization; Resists; Inorganic photo resist; linear range; numerical aperture; optical pickup head;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/TMAG.2010.2100813
Filename
5721845
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