Review of Noise Sources in Magnetic Tunnel Junction Sensors

Author

Lei, Z.Q. ; Li, G.J. ; Egelhoff, William F., Jr. ; Lai, P.T. ; Pong, Philip W T

Author_Institution

Dept. of Electr. & Electron. Eng., Univ. of Hong Kong, Hong Kong, China

Volume

47

Issue

3

fYear

2011

fDate

3/1/2011 12:00:00 AM

Firstpage

602

Lastpage

612

Abstract

Noise problem limits the sensitivity of magnetic tunnel junction (MTJ) sensors for ultra-low magnetic field applications. Noise analysis not only helps in finding ways to eliminate noise disturbances but also essential for understanding the electronic and magnetic properties of MTJs. These approaches provide insight for optimizing the design of MTJ sensors before fabrication. This paper reviews the noise sources in MTJ sensors reported in recent years. Both the origins and mathematical derivations of the noise sources are presented, illustrating how different factors affecting the performance of MTJ sensors. A brief outlook of challenges in the future is also given.

Keywords

magnetic noise; magnetic sensors; magnetic tunnelling; MTJ sensors; magnetic tunnel junction sensors; mathematical derivations; noise analysis; noise disturbances; noise problem; noise sources; ultralow magnetic field applications; Magnetic noise; Magnetic sensors; Magnetic tunneling; Noise; Thermal noise; Tunneling magnetoresistance; $1/f$ noise; Johnson noise; magnetic noise; magnetic tunnel junction (MTJ); shot noise; thermal noise;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/TMAG.2010.2100814

Filename

5721852