Architecture of a testable analog fuzzy logic controller

The authors discuss problems of testability of analog fuzzy logic controllers implemented as VLSI chips. Enhancements to standard architecture of fuzzy logic controllers which facilitate testing are proposed. To improve controllability and observability of internal nodes, analog switching blocks are introduced together with some additional circuitry. These blocks allow one to test each basic cell of a fuzzy logic controller (e.g., membership function cell, MINIMAX cell, etc.) separately. The analog switching blocks do not contribute to the power consumption in a working chip end therefore can be used in low-power analog fuzzy logic controllers