DocumentCode
1461992
Title
Enhanced Structural and Magnetic Ordering of FePt/Mn-Oxide Bilayers by Ion-Beam Bombardment and Annealing
Author
Sun, An-Cheng ; Hsu, H.F. ; Wu, H.J. ; Hsu, J.H. ; Pong, P.W.T. ; Suzuki, T. ; Lin, K.W.
Author_Institution
Dept. of Chem. Eng. & Mater. Sci., Yuan Ze Univ., Chungli, Taiwan
Volume
47
Issue
3
fYear
2011
fDate
3/1/2011 12:00:00 AM
Firstpage
501
Lastpage
504
Abstract
Structural and magnetic properties of FePt thin films were affected strongly by capped MnOx layers prepared by ion-beam bom-bardment and post-annealing. As-deposited FePt/MnOx bilayer exhibited a magnetically soft fee phase, and it turned to an ordered fct FePt phase with large coercivity (~8 kOe) after annealing at 550°C. Increasing the %02/Ar in capped MnOx layer during de position resulted in smaller ordered FePt grains separated by grain boundaries of MnOx. We found that the superlattice (001) peak is broadened considerably with larger amount of MnOx incorporated into FePt, likely due to the hindered formation of hard phase. Our results indicate that FePt/MnOx films deposited with lower %02/Ar, the oxygen atoms may occupy the interstitial positions in the FePt lattice to induce a local strain thus enhancing the FePt ordering. Further increased %02/Ar in capped MnOx layer, the excess oxygen atoms act a diffusion barrier effectively to inhibit the FePt grain growth and ordering.
Keywords
annealing; coercive force; diffusion barriers; grain growth; ion beam effects; iron alloys; magnetic thin films; manganese compounds; platinum alloys; sputter deposition; superlattices; FePt-MnOx; annealing; diffusion barrier; grain growth; interstitial positions; ion-beam bombardment; large coercivity; magnetic ordering; magnetically soft fcc phase; structural ordering; superlattice (001) peak; temperature 550 degC; Annealing; Argon; Coercive force; Magnetic domains; Magnetic properties; Magnetic recording; Magnetic separation; FePt; ion-beam bombardment; magnetic films; phase transformation;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/TMAG.2010.2099111
Filename
5721867
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