Author :
Dabrowski, W. ; Anghinolfi, Francis ; Buttar, C. ; Cindro, V. ; Clark, A.G. ; Dawson, I. ; Dorfan, D. ; Dubbs, T. ; Falconer, N. ; French, M. ; Greenall, A. ; Grillo, A.A. ; Happer, R. ; Jarron, P. ; Kaplon, J. ; Kudlaty, J. ; Kramberger, G. ; Lacasta, C.
Author_Institution :
Fac. of Phys. & Nucl. Tech., UMM, Krakow, Poland
Abstract :
The ABCD design is a single chip implementation of the binary readout architecture for silicon strip detectors in the ATLAS semiconductor tracker. The prototype chip has been manufactured successfully in the DMILL process. In the paper we present the design of the chip and the measurement results. The basic analogue performance of the ABCD design has been evaluated using a prototype SCT module equipped with the ABCD chips. The digital performance has been evaluated using a general purpose IC tester. The measurements confirmed that all blocks of the ABCD design are fully functional and the chips meet all basic requirements of the SCT. Wafer screening has been performed using a customised wafer tester
Keywords :
digital readout; integrated circuit design; integrated circuit testing; mixed analogue-digital integrated circuits; nuclear electronics; silicon radiation detectors; ABCD chip; ATLAS semiconductor tracker; DMILL process; Si; Si strip detectors; basic analogue performance; binary readout; chip design; chip performance; customised wafer tester; digital performance; general purpose IC tester; prototype SCT module; prototype chip; single chip implementation; wafer screening; Detectors; Digital integrated circuits; Integrated circuit testing; Manufacturing processes; Performance evaluation; Prototypes; Semiconductor device manufacture; Semiconductor device measurement; Silicon; Strips;
