DocumentCode :
1462253
Title :
Large Irreversible Lateral Photovoltaic Effect in  \\hbox {Cu}_{2}\\hbox {O/Si} Heteroepitaxial Junction
Author :
Du, L. ; Wang, H.
Author_Institution :
Dept. of Phys., Shanghai Jiao Tong Univ., Shanghai, China
Volume :
32
Issue :
4
fYear :
2011
fDate :
4/1/2011 12:00:00 AM
Firstpage :
539
Lastpage :
541
Abstract :
A rather large irreversible lateral photovoltage (LPV) effect has been observed in Cu2O/Si heteroepitaxial junctions. Large output voltage and high linearity indicate that a Cu2O/Si heterojunction is competent to be a new candidate for position-sensitive photodetectors. The irreversible LPV on both sides of the junction challenges the Dember effect which was usually introduced to explain this phenomenon in oxide heterojunctions. A mechanism based on the difference of carrier mobility in each side of the junction has been applied, and a diffusion recombination model is later confirmed experimentally by applying an external bias.
Keywords :
Dember effect; carrier mobility; copper compounds; elemental semiconductors; photovoltaic effects; semiconductor epitaxial layers; semiconductor heterojunctions; silicon; Cu2O-Si; Dember effect; Si; carrier mobility; diffusion recombination model; external bias; heteroepitaxial junctions; large irreversible lateral photovoltage effect; large irreversible lateral photovoltaic effect; position-sensitive photodetectors; Electrodes; Heterojunctions; Measurement by laser beam; Semiconductor lasers; Sensitivity; Silicon; Heterojunctions; photodetectors; photovoltaic effects; thin films;
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/LED.2011.2109034
Filename :
5722019
Link To Document :
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