• DocumentCode
    1462253
  • Title

    Large Irreversible Lateral Photovoltaic Effect in  \\hbox {Cu}_{2}\\hbox {O/Si} Heteroepitaxial Junction

  • Author

    Du, L. ; Wang, H.

  • Author_Institution
    Dept. of Phys., Shanghai Jiao Tong Univ., Shanghai, China
  • Volume
    32
  • Issue
    4
  • fYear
    2011
  • fDate
    4/1/2011 12:00:00 AM
  • Firstpage
    539
  • Lastpage
    541
  • Abstract
    A rather large irreversible lateral photovoltage (LPV) effect has been observed in Cu2O/Si heteroepitaxial junctions. Large output voltage and high linearity indicate that a Cu2O/Si heterojunction is competent to be a new candidate for position-sensitive photodetectors. The irreversible LPV on both sides of the junction challenges the Dember effect which was usually introduced to explain this phenomenon in oxide heterojunctions. A mechanism based on the difference of carrier mobility in each side of the junction has been applied, and a diffusion recombination model is later confirmed experimentally by applying an external bias.
  • Keywords
    Dember effect; carrier mobility; copper compounds; elemental semiconductors; photovoltaic effects; semiconductor epitaxial layers; semiconductor heterojunctions; silicon; Cu2O-Si; Dember effect; Si; carrier mobility; diffusion recombination model; external bias; heteroepitaxial junctions; large irreversible lateral photovoltage effect; large irreversible lateral photovoltaic effect; position-sensitive photodetectors; Electrodes; Heterojunctions; Measurement by laser beam; Semiconductor lasers; Sensitivity; Silicon; Heterojunctions; photodetectors; photovoltaic effects; thin films;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/LED.2011.2109034
  • Filename
    5722019