Title :
A preamplifier-shaper-stretcher integrated circuit system for use with germanium strip detectors
Author :
Jagdish, U. ; Britton, C.L., Jr. ; Ericson, M.N. ; Bryan, W.L. ; Schwarz, W.G. ; Read, M.E. ; Kroeger, R.A.
Author_Institution :
Oak Ridge Nat. Lab., TN, USA
fDate :
12/1/2000 12:00:00 AM
Abstract :
A 16-channel integrated circuit readout electronics chip is being developed for use with a germanium strip detector. Such a system will provide superior energy resolution with 2-dimensional imaging in a single instrument that can be used for X-ray imaging and nuclear line gamma-ray spectroscopy. As part of the total ASIC development, prototype ICs of a typical channel have been designed, fabricated and tested. These integrated circuits include a low-noise, variable gain, preamplifier circuit that can detect both positive and negative going input charges, a 4-pole pulse shaper with variable peaking times and a stretcher circuit that can do a peak detect and hold for the different peaking times. The integrated circuits are fabricated in a 1.2 micron n-well CMOS process. The noise performance for this system was measured to be 185erms +14e/pF for a 2 μs peaking time and gain at ~200 mV/fC. Linearity measurements in both inverting and non-inverting modes of operation were approximately +/-1%. Peaking times from 0.5 microseconds to 8 microseconds and gain adjustments to get up to 400 mV/fC per channel were done through digital switching
Keywords :
CMOS integrated circuits; X-ray detection; X-ray imaging; application specific integrated circuits; gamma-ray detection; gamma-ray spectroscopy; germanium radiation detectors; integrated circuit design; integrated circuit manufacture; integrated circuit testing; nuclear electronics; position sensitive particle detectors; preamplifiers; pulse shaping circuits; readout electronics; semiconductor device noise; 0.5 to 8 mus; 16-channel integrated circuit readout electronics chip; 2 mus; 4-pole pulse shaper; ASIC; Ge; IC design; IC fabrication; IC testing; X-ray imaging; energy resolution; gain adjustments; linearity; n-well CMOS process; noise performance; nuclear line gamma-ray spectroscopy; peaking times; preamplifier-shaper-stretcher integrated circuit system; prototype IC; strip detectors; Detectors; Energy resolution; Germanium; Instruments; Integrated circuit measurements; Optical imaging; Readout electronics; Spectroscopy; Strips; X-ray imaging;
Journal_Title :
Nuclear Science, IEEE Transactions on