DocumentCode :
1462286
Title :
Sapphire Substrate Liftoff With Photoelectrochemical Etching for Vertical Light-Emitting Diode Fabrication
Author :
Lin, Cheng-Hung ; Chen, Chih-Yen ; Liao, Che-Hao ; Hsieh, Chieh ; Kiang, Yean-Woei ; Yang, Chih-Chung
Author_Institution :
Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
Volume :
23
Issue :
10
fYear :
2011
fDate :
5/15/2011 12:00:00 AM
Firstpage :
654
Lastpage :
656
Abstract :
The method of sapphire substrate liftoff for the fabrication of vertical nitride light-emitting diode (LED), based on the combination of the photoelectrochemical (PEC) etching and epitaxial lateral overgrowth (ELOG) techniques, is demonstrated. This method relies on the formation of connected voids during the ELOG process on a GaN template such that PEC electrolyte can approach the GaN portions above the SiO2 masks. Also, the GaN template must be thin enough for the illuminating ultraviolet light to reach the GaN portions above the SiO2 masks. It is shown that PEC etching starts from a very thin layer of GaN right above a SiO2 mask. It then extends into the window regions of ELOG to completely separate GaN from sapphire. The performances of a vertical LED are illustrated.
Keywords :
III-V semiconductors; etching; gallium compounds; light emitting diodes; photoelectrochemistry; voids (solid); wide band gap semiconductors; GaN; LED; PEC electrolyte; SiO2; connected voids; epitaxial lateral overgrowth; photoelectrochemical etching; sapphire substrate liftoff; ultraviolet light; vertical nitride light-emitting diode; Etching; Gallium nitride; Light emitting diodes; Rough surfaces; Substrates; Surface roughness; Photoelectrochemical (PEC) etching; sapphire substrate liftoff; vertical light-emitting diode (LED);
fLanguage :
English
Journal_Title :
Photonics Technology Letters, IEEE
Publisher :
ieee
ISSN :
1041-1135
Type :
jour
DOI :
10.1109/LPT.2011.2121899
Filename :
5722024
Link To Document :
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